You will have to replace standard Scofield cross-section library by the Kratos one, after you download CasaXPS. Please note, that Kratos relative sensitivity factor library is used in MATFab room 198 by our staff. The zip file contains the excutable together with default library (based on Scofield cross-sections), HTML help maual and configuration files (~25Mb). You can find it at The latest release is 2.3.12 and can be downloaded from the web-page.
Other applications include fast parallel elemental, Auger and secondary election imaging, Auger spectroscopy, and UPS spectroscopy.ĭata Processing The University of Iowa purchased a site license for data processing software, CasaXPS by Neal Fairley. Non-destructive depth profiling using angle-resolved XPS. Presence of trace elements, mineral, etc. Elemental information from thin layers (sections). Characterization catalysis products and intermediates. Characterization of surface components on catalyst. Bonding information, presence of catalysts traces, etc. Functional groups according to the chemical shift. 
Parallel imaging of chemical state (Si vs SiO2). The resulting spectrum is obtained from the sample layers within ~10 nm in depth thus giving great surface sensitivity. Emitted photoelectrons are being analyzed by energy in the analyzer and plotted as a function of binding energy. Soft x-rays are used to probe the outer layers of the sample.
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